Teltec Pacific is a technical Sales and Service organisation serving the Semiconductor, Photonics and Optoelectronics Industries in Asia Pacific countries.

Filmetrics - Thin Film Thickness Measurement


Filmetrics is the manufacturer of thickness measurement systems. Filmetrics’ thickness and retractive index can be measured in less than a second. L

ike all of Filmetrics’ instruments, e.g. model F20 connects to the USB port of user’s Windows computer and sets up in minutes.

100 kinds of materials with basic information have been saved in software and could be used to measure multi-layer films. New material with optical

index could be stored for

Film Thickness Measurement Systems

Measured film:flat, semi-transparent, absorb light film.
Example  : SiO2 SiNX DLC, photoresist, poly-si,

                  amorphous - Si, Si wafer
Substrates: flat, reflective

If one want to get optical index, the substrates should be flat and reflective. Reflective processing should be done if the substrate is transparent.

Substrates:Si, Al, GaAs, Steel, Polymer film,




F30: Integrated Film Thickness
Measurement Systems

F40: Microscopy Film Thickness
Measurement Systems

F50: Automated Thickness Mapping Systems

The Most Powerful Tool Available for Monitoring Thin-Film Deposition

Measure deposition rates, film thickness, optical constants (n and k), and uniformity of semiconductors and dielectric layers in real-time with the F30 spectral reflectance system.

The F40 product family is for applications that require a spot size as small as 1 micron. For most microscopes the F40 simply attaches to the Cmount adapter, which is the industry standard for video camera mounting. Fully-automatic mapping of thickness and index for nearly any sample shape. Manual-load and robotic-load systems are available.