Olympus

Olympus Corporation

Japan Olympus Industrial Microscopes

Optical microscopes are microscopes that typically use visible light and a system of lenses to magnify images of small samples. Industrial microscopes incorporate many complex designs that aim to improve resolution and sample contrast. Images from an optical microscope can be captured by normal light-sensitive cameras to generate a micrograph. Modern developments in CMOS and charge-coupled device (CCD) cameras allow the capture of digital images. Digital microscopes are available with a CCD camera to examine a sample, and the image is shown directly on a computer screen without the need for eye-pieces.

Semiconductor & Flat Panel Display Inspection Microscopes

The MX61A is a specially designed semiconductor microscope that allows operators to work in an ergonomically correct position and benefit from smoother operation throughout extended inspection periods。The best in imaging performance has been improved through the introduction of the new UIS2 optical system employed by the MX61A. Clear, crisp, true color images are evident in all illumination techniques including brightfield, darkfield and differential interference contrast (DIC).

The MX61L/ MX61, 300 mm/ 200 mm semiconductor inspection microscope provides exceptional image resolution and clarity through observation methods such as brightfield, darkfield, differential interference contrast (DIC), fluorescence and infrared.

The MX51 industrial inspection microscope is cost-effective and optimized for the inspection requirements of a variety of electronic components, wafers and large samples. The controls of the MX51 are positioned at the front of the microscope, easy for the operator to access and manipulate. The built-in clutch of the 150mm stage enables quick stage positioning, reducing operator fatigue.

MX-IR/BX-IR contain dedicated IR objective lenses and components that are corrected for chromatic aberrations and designed for 700-1300nm wavelengths. With a near-infrared microscope, however, non-destructive internal observation of an IC chip after packaging is possible by the transmission properties of silicon. This technique makes failure analysis of the flip chip package a simple one and is also effective for identifying locations to be processed with FIB (Focused Ion Beam).

The AL120-12 wafer handler is compatible with both FOUP (Load Port) and FOSB, ideal for lower cost back-end inspection. The safe and ergonomic design maintains operator safety while effectively transferring wafers including thin and warped wafers.

The AL120 wafer handler series transfers both silicon and compound semiconductor wafers from the cassette to the microscope stage with enhanced capabilities and flexibility, while maintaining an ergonomic design.

Stereo Microscopes

The versatile SZX16 microscope is designed for very demanding applications with the ability to resolve 900 line pair/mm. Utilization of the full zoom range (0.7x - 11.5x) can be accomplished with our dual turret.

The SZX10 microscope is the logical choice when working distance and field size are important. Our careful system selection of lens design allows the observation and documentation of specimens in their original, authentic colors without distortion.

The SZX7 stereo microscope, features a 7:1 zoom ratio and built in Electro Static Discharge protection, uses an advanced Galilean optical system, providing brilliant highly resolved images with easy access controls for comfortable viewing at an affordable price.

The SZ51 and SZ61 microscopes, deliver images with superb depth of field as well as clarity, detail and true-to-life color and built in ESD protection. Their dependable, high-performance optics are central to producing consistent accurate results.

Measuring Microscopes

The STM6-LM microscopes equipping a 250 x 150 mm stage offer excellent versatility and high performance three axis measurements of parts and electrical components, with sub-micron precision. Low magnification option makes this ideal for toolmakers.

The STM6 microscopes offer excellent versatility and high performance three axis measurements of parts and electrical components, with sub-micron precision. Low magnification option makes this ideal for toolmakers.